Services : We will analyse and report on Imaging, Topography, Feature Size, Particle/Defect Identification, Morphology
Compounds and Devices: Silicon (Si), Silicon Carbide(SiC), Galium Nitride (GaN), VCSEL, LED, Lasers, Optical Devices etc.
Technologies: SEM, TEM, STEM, AC-STEM, EDX and EELS etc.
Expertise: CAS has extensive experience in the following industries: